| Specifications | |
| Wafer Size | 8 inch |
| Wafer Thickness | 725±25μm |
| Chip Size | 20.0mm |
| Layer | Layer1: cu wiring |
| Metal Material | Cu |
| Cu Thickness | 1.5 ~ 2.5μm |
| Number of Pad | 56 pads |
| Pad Size | 160μm |
| Measurement Pad Size | 2.0mm / 0.9mm |
| Number of Chip | 57 chips/wafer |
| Evaluation Pattern |
・Comb pattern Comb pattern L/S dimension ・Wiring pattern for break check 10.0μm, 2.0μm, 1.5μm, 1.0μm(length: 2.0mm, 1.0mm) |